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  • 1. ChinaXiv:201609.01042
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    The cosmic ray test of MRPCs for the BESIII ETOF upgrade

    分类: 物理学 >> 核物理学 提交时间: 2016-09-14

    Wang Xiao-Zhuang Heng Yue-Kun Wu Zhi Li Cheng Sun Yong-Jie Dai Hong-Liang Sun Sheng-Sen Yang Rong-Xing Cao Ping Zhang Jie Wang Yun Sun Wei-Jia Wang Si-Yu Ji Xiao-Lu Zhao Jin-Zhou Gong Wen-Xuan Ye Mei Ma Xiao-Yan Chen Ming-Ming Xu Mei-hang

    摘要: In order to improve the particle identification capability of the Beijing Spectrometer III (BESIII),t is proposed to upgrade the current endcap time-of-flight (ETOF) detector with multi-gap resistive plate chamber (MRPC) technology. Aiming at extending ETOF overall time resolution better than 100ps, the whole system including MRPC detectors, new-designed Front End Electronics (FEE), CLOCK module, fast control boards and time to digital modules (TDIG), was built up and operated online 3 months under the cosmic ray. The main purposes of cosmic ray test are checking the detectors' construction quality, testing the joint operation of all instruments and guaranteeing the performance of the system. The results imply MRPC time resolution better than 100ps, efficiency is about 98%燼nd the noise rate of strip is lower than 1Hz/(scm2) at normal threshold range, the details are discussed and analyzed specifically in this paper. The test indicates that the whole ETOF system would work well and satisfy the requirements of upgrade.

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     点击量 3994  下载量 2051  评论 0
  • 2. ChinaXiv:201609.00002
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    The test of the electronics system for the BESIII ETOF upgrade

    分类: 物理学 >> 核物理学 提交时间: 2016-09-01

    WANG Xiao-Zhuang DAI Hong-Liang WU Zhi HENG Yue-Kun Zhang Jie CAO Ping JI Xiao-Lu Li Cheng SUN Wei-Jia WANG Si-Yu WANG Yun

    摘要: It is proposed to upgrade the endcap time-of-flight (ETOF) of the Beijing Spectrometer III (BESIII) with multi-gap resistive plate chamber (MRPC), aiming at overall time resolution about 80 ps. After the entire electronics system is ready, some experiments, such as heat radiating, irradiation hardness and large-current beam tests,are carried out to certify the electronics' reliability and stability. The on-detector test of the electronics is also performed with the beam at BEPCII E3 line, the test results indicate that the electronics system fulfills its design requirements.

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     点击量 3820  下载量 1760  评论 0
友情链接 : ChinaXiv PubScholar 哲学社会科学预印本
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